发明名称 SLURRY COMPOSITION FOR CMP AND FORMING METHOD OF POLY PLUG OF SEMICONDUCTOR DEVICE USING THE SAME
摘要 PURPOSE: A slurry composition for CMP(Chemical Mechanical Polishing) and a method for forming a poly plug of a semiconductor device using the same are provided to prevent Pinocchio defect and loss of a hard mask by using the slurry containing an anionic compound. CONSTITUTION: A composite slurry composition includes an anionic compound, an abrasive and a water. The anionic compound is one selected from group consisting of lauric acid, oleic acid, stearic acid, sodium stearate, sodium lauric sulfate, sodium lauryl ether sulfate, ammonium lauryl sulfate, triethanol ammonium lauryl sulfate, sodoum octyl sulfate, dodecyl benzene sulfonic acid, sodium dodecyl benzene sulfonate, lauryl ether phosphate, and dimethyl laurylamine.
申请公布号 KR20040060138(A) 申请公布日期 2004.07.06
申请号 KR20020086668 申请日期 2002.12.30
申请人 HYNIX SEMICONDUCTOR INC. 发明人 JUNG, JONG GU;PARK, HYEONG SUN
分类号 H01L21/304;(IPC1-7):H01L21/304 主分类号 H01L21/304
代理机构 代理人
主权项
地址