发明名称 |
METHOD AND APPARATUS FOR POLISHING SILICON WAFER |
摘要 |
PURPOSE: A method and an apparatus for polishing a silicon wafer are provided to prevent various external contaminants by removing positive electric charges from a surface of a silicon wafer after polishing the silicon wafer. CONSTITUTION: A silicon wafer is mounted on an adhesive plate, which is installed on a polishing head of a polishing apparatus(S1). A polishing process is performed on a surface of the silicon wafer by using a polishing slurry after the silicon wafer is closed to the polishing pad(S2). A polishing side of the silicon wafer is separated from the polishing pad and a surfactant is injected into the polishing side of the silicon wafer(S3).
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申请公布号 |
KR20040058881(A) |
申请公布日期 |
2004.07.05 |
申请号 |
KR20020085397 |
申请日期 |
2002.12.27 |
申请人 |
SILTRON INC. |
发明人 |
JUNG, EUN DO;KIM, HYEON CHEOL |
分类号 |
H01L21/304;(IPC1-7):H01L21/304 |
主分类号 |
H01L21/304 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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