发明名称 FLASH MEMORY DEVICE AND FORMING METHOD THEREOF
摘要 PURPOSE: A flash memory device and a forming method thereof are provided to increase the coupling ratio between a floating gate and a control gate by deeply forming a contact hole without the limitation for height according to a bit line. CONSTITUTION: A flash memory device is provided with a floating gate, a control gate(91) on the floating gate, and a bit line(75) spaced apart from one side of the floating gate. The floating gate includes a lower floating gate(61) on a substrate(41) and an upper floating gate(87) opposite to the control gate in a contact hole. The contact hole has a desired depth. The upper floating gate is formed like a sidewall spacer. A dielectric layer(89) is between the upper floating gate and the control gate. The floating gate further includes a connection plug(81) through an interlayer dielectric for connecting the lower floating gate with the upper floating gate.
申请公布号 KR20040058563(A) 申请公布日期 2004.07.05
申请号 KR20020084869 申请日期 2002.12.27
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 JANG, SEONG NAM;LEE, WON HONG;SHIN, GWANG SIK
分类号 H01L27/115;(IPC1-7):H01L27/115 主分类号 H01L27/115
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