发明名称 |
DISTURBANCE-FREE PLASMA PROCESSING/CONTROLLING SYSTEM AND METHOD |
摘要 |
<p>PURPOSE: Disturbance-free, recipe-controlled plasma processing/controlling system and method are provided to suppress inter-lot fluctuation, in-lot fluctuation and variance by using a feedback control or feedforward control applied on the basis of the outputs of sensors monitoring process parameters or on the basis of a measured result. CONSTITUTION: A plasma processing apparatus(23) performs a plasma processing operation over a sample accommodated within a vacuum processing chamber. A sensor(24) monitors process parameters during the processing operation. A processed-result estimation model member(25) estimates a processed result on the basis of a monitored output and a preset processed-result estimation equation. An optimum recipe calculation model member(26) calculates optimum processing conditions such that the processed result becomes a target value on the basis of the estimated result of the processed-result estimation model member. An usable recipe determiner judges validity of an optimum recipe. A controller for controls the plasma processing apparatus on the basis of the usable recipe determined by the usable recipe determiner.</p> |
申请公布号 |
KR20040058162(A) |
申请公布日期 |
2004.07.03 |
申请号 |
KR20040045674 |
申请日期 |
2004.06.18 |
申请人 |
HITACHI, LTD. |
发明人 |
KAGOSHIMA AKIRA;YAMAMOTO HIDEYUKI;IKUHARA SHOJI;MASUDA TOSHIO;KITSUNAI HIROYUKI;TANAKA JUNICHI;MORIOKA NATSUYO;TAMAKI KENJI |
分类号 |
H05H1/00;B01J19/08;H01J37/32;H01L21/302;H01L21/3065;H01L21/66;(IPC1-7):H01L21/306 |
主分类号 |
H05H1/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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