发明名称 METHOD FOR FORMING SHALLOW TRENCH ISOLATION LAYER OF SEMICONDUCTOR DEVICE
摘要 PURPOSE: A method for forming an STI(Shallow Trench Isolation) layer of a semiconductor device is provided to prevent dishing and to improve process margin by adding a polish agent with positive zeta potential to a slurry. CONSTITUTION: A pad nitride layer(102) is formed on a semiconductor substrate(100). A shallow trench(104) is formed. An oxide layer is filled in the shallow trench. The oxide layer is polished by CMP(Chemical Mechanical Polishing) using a slurry added in a polish agent(108) with positive zeta potential. The remaining pad nitride layer is removed.
申请公布号 KR20040057653(A) 申请公布日期 2004.07.02
申请号 KR20020084420 申请日期 2002.12.26
申请人 HYNIX SEMICONDUCTOR INC. 发明人 YOON, IL YEONG
分类号 H01L21/762;(IPC1-7):H01L21/762 主分类号 H01L21/762
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