发明名称 |
METHOD FOR FORMING SHALLOW TRENCH ISOLATION LAYER OF SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A method for forming an STI(Shallow Trench Isolation) layer of a semiconductor device is provided to prevent dishing and to improve process margin by adding a polish agent with positive zeta potential to a slurry. CONSTITUTION: A pad nitride layer(102) is formed on a semiconductor substrate(100). A shallow trench(104) is formed. An oxide layer is filled in the shallow trench. The oxide layer is polished by CMP(Chemical Mechanical Polishing) using a slurry added in a polish agent(108) with positive zeta potential. The remaining pad nitride layer is removed.
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申请公布号 |
KR20040057653(A) |
申请公布日期 |
2004.07.02 |
申请号 |
KR20020084420 |
申请日期 |
2002.12.26 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
YOON, IL YEONG |
分类号 |
H01L21/762;(IPC1-7):H01L21/762 |
主分类号 |
H01L21/762 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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