发明名称 METHOD FOR FORMING PLUG OF SEMICONDUCTOR DEVICE
摘要 PURPOSE: A method for forming a plug of a semiconductor device is provided to prevent dishing by minimizing the difference of polishing selectivity between a polysilicon layer and an interlayer dielectric or a hard mask in CMP. CONSTITUTION: A gate stacked structure(100) including a gate(12) and a hard mask(13) is formed on a substrate(10). An interlayer dielectric is formed on the resultant structure. A contact hole is formed by selectively etching the interlayer dielectric. A polysilicon layer is filled in the contact hole. Self-silicon ion-implantation processing is performed to increase the content of silicon in the interlayer dielectric and the hard mask. A plug(16A) is then formed by CMP of the polysilicon layer.
申请公布号 KR20040057554(A) 申请公布日期 2004.07.02
申请号 KR20020084315 申请日期 2002.12.26
申请人 HYNIX SEMICONDUCTOR INC. 发明人 AHN, TAE HANG;LEE, MIN YONG
分类号 H01L21/28;(IPC1-7):H01L21/28 主分类号 H01L21/28
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