| 摘要 |
PROBLEM TO BE SOLVED: To solve the problem of difficulty in miniaturizing a contact pin formed in machining, related to an electric circuit measuring device that measures electric characteristics at an arbitrary part. SOLUTION: The function or electric characteristics at parts 21-29 which are to be measured at an arbitrary position of an electric circuit 20 is measured via contact pins 411-419. A first substrate 45 faces the electric circuit 20. A second substrate 46 is laminated on the first substrate. First metal members 411A-419A are incorporated, while penetrating, in the lamination direction at such part of the first substrate 45 as faces the measured parts 21-29. Second metal members 411B-419B are incorporated, while penetrating in the lamination direction at the arbitrary part of the second substrate 46. The metal members 411A-419A and 411B-419B incorporated in the adjoining substrates 45 and 46 abut on each other to constitute the contact pins 411-419. COPYRIGHT: (C)2004,JPO&NCIPI
|
