发明名称 METHOD FOR MANUFACTURING PHASE SHIFT MASK
摘要 PURPOSE: A method for manufacturing a phase shift mask is provided to prevent failure of patterns due to charging by forming a conductive layer before coating a photoresist layer. CONSTITUTION: A mask substrate(100) with a light shielding region and a light transmission region is prepared. A phase shifting layer and a light shielding layer are sequentially formed on the mask substrate. A light shielding pattern(104a) and a phase shifting pattern(102a) are formed by patterning the light shielding layer and the phase shifting layer using the first photoresist pattern as a mask. A conductive layer(108) and the second photoresist layer(110) are sequentially formed on the resultant structure. The second photoresist pattern is formed by re-exposing and re-developing the second photoresist layer and the conductive layer. The exposed light shielding pattern is peeled by using the second photoresist pattern. Then, the second photoresist pattern is removed.
申请公布号 KR20040057654(A) 申请公布日期 2004.07.02
申请号 KR20020084421 申请日期 2002.12.26
申请人 HYNIX SEMICONDUCTOR INC. 发明人 YOO, GON SIK
分类号 H01L21/027;(IPC1-7):H01L21/027 主分类号 H01L21/027
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