发明名称 METHOD FOR MANUFACTURING THIN-FILM TRANSISTOR
摘要 PROBLEM TO BE SOLVED: To provide a method for manufacturing a thin-film transistor which produces no residue of a gettering sink, when removing the gettering sink by an etchant of alkali solution, having high selection ratio of a barrier film that functions as an etching stopper and the gettering sink. SOLUTION: Concentration of nitrogen in a semiconductor film which is to become a gettering sink is set to be 1×10<SP>18</SP>atoms/cm<SP>3</SP>or lower, its oxygen concentration is set to 8×10<SP>19</SP>atoms/cm<SP>3</SP>, and its rare gas element concentration is set to 1×10<SP>20</SP>atoms/cm<SP>3</SP>. In order to attain the impurity concentration, combustible gas is used and oxygen, which is an impurity in a chamber is burned and exhausted, and reduced. COPYRIGHT: (C)2004,JPO&NCIPI
申请公布号 JP2004186683(A) 申请公布日期 2004.07.02
申请号 JP20030390157 申请日期 2003.11.20
申请人 SEMICONDUCTOR ENERGY LAB CO LTD 发明人 MAEKAWA SHINJI;AKIMOTO KENGO
分类号 H01L51/50;H01L21/20;H01L21/203;H01L21/308;H01L21/322;H01L21/336;H01L29/786;H05B33/14;(IPC1-7):H01L21/336 主分类号 H01L51/50
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