发明名称 METHOD AND SYSTEM FOR REMOTE CONTROLLING ELECTRON MICROSCOPE
摘要 PROBLEM TO BE SOLVED: To provide a method for remote controlling an electron microscope capable of accurately adjusting an electron microscope such as a scanning electron microscope even in bad environment of a network. SOLUTION: The image signal transferred through a network 23 is supplied and stored in a freeze image memory 31. When adjusting operation is started, the image signal stored in the freeze image memory 31 is supplied to a display 30. Then, the image signal stored in the freeze image memory 31 is supplied to a contrast adjusting part 33 and a brightness adjusting part 32. The contrast adjusting part 33 detects an amplitude value of the image signal, and the detected value is adjusted by an operator to generate a contrast adjusted value. The brightness adjusting part 32 detects a DC component value of the image signal, and the detected value is adjusted by an operator to generate a brightness adjusted value. COPYRIGHT: (C)2004,JPO&NCIPI
申请公布号 JP2004186003(A) 申请公布日期 2004.07.02
申请号 JP20020352083 申请日期 2002.12.04
申请人 JEOL LTD 发明人 YAMADA ATSUSHI
分类号 H01J37/24;(IPC1-7):H01J37/24 主分类号 H01J37/24
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