发明名称 LITHOGRAPHIC APPARATUS CAPABLE OF CONFIGURING AND REVISING BEAM INTENSITY DISTRIBUTION QUICKLY AND DEVICE MANUFACTURING METHOD
摘要 PURPOSE: A lithographic apparatus and a device manufacturing method are provided to configure and revise an intensity distribution of a beam on a pupil plane. CONSTITUTION: A lithographic apparatus includes an illumination system, a support structure, and a substrate table. The illumination system provides a projection beam of radiation(PB) and includes a first optical element(120a) constructed and arranged to deflect the projection beam over a first range of directions with a direction dependent intensity distribution. The lithographic apparatus further includes a second optical element(120b) and a blocking element. Each of the first optical element and the second optical element is arranged to pass a major portion of the projection beam substantially without deflection. The second optical element deflects a portion of the major portion of the projection beam passed by the first optical element over a second range of directions . The blocking element blocks transmission to the substrate of the part of intensity of the projection beam passed undeflected by both the optical element and the second optical element.
申请公布号 KR20040057958(A) 申请公布日期 2004.07.02
申请号 KR20030094758 申请日期 2003.12.22
申请人 ASML NETHERLANDS B.V. 发明人 BOTMA HAKO
分类号 G03F7/20;H01L21/027;(IPC1-7):H01L21/027 主分类号 G03F7/20
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