发明名称 CUTTING DEVICE FOR SEMICONDUCTOR SUBSTRATE AND CUTTING METHOD
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a cutting device for a semiconductor substrate and a cutting method with reduced occurrence of cracks, fractures, etc. at the time of cutting the semiconductor substrate. <P>SOLUTION: The cutting device for a semiconductor substrate is provided with a cutting means for cutting a semiconductor substrate 1, supporting boards 5 and 6 for supporting the semiconductor substrate 1, and fixing means 7 and 8 fixing both sides of a region to be the cutting line of the semiconductor substrate 1. The above fixing means 7 and 8 include workpiece holders 7 and 8 in the region at least on one side to the cutting line, and include a pinching means fixing the semiconductor substrate 1 in such a manner as to sandwich it between the supporting boards 5 and 6 and the workpiece holders 7 and 8. Preferably, the above cutting means has an irradiating function of a laser beam 20. <P>COPYRIGHT: (C)2004,JPO&NCIPI</p>
申请公布号 JP2004186635(A) 申请公布日期 2004.07.02
申请号 JP20020355045 申请日期 2002.12.06
申请人 SHARP CORP 发明人 OISHI RYUICHI
分类号 B26F3/00;B23K26/00;B23K26/10;B23K26/14;B23K26/18;B23K26/40;H01L21/301;(IPC1-7):H01L21/301 主分类号 B26F3/00
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