发明名称 FLASH MEMORY DEVICE HAVING UNIFORM THRESHOLD VALUE VOLTAGE DISTRIBUTION WITHOUT HAVING NON-PROGRAMMED CELL AND OVER-PROGRAMMED CELL AND ITS PROGRAM VERIFICATION METHOD
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a flash memory device having uniform threshold voltage distribution without having non-programmed and over-programmed cells and its program verification method. <P>SOLUTION: The device is provided with a memory cell array block in which a plurality of flash memory cells are arranged, a program verification voltage generating section which generates program verification voltages in a variable manner, a wordline level selection section which transmits the program verification voltage and a page buffer which includes a latch that stores the data of the flash memory cells and resets the latch whenever the program verification voltage becomes low. During a prescribed number of program cycles, the program verification voltage is made same, program verification is performed, the voltage is made lower and a first latch of the page buffer is reset at a program unit loop in which the program verification voltage becomes low. <P>COPYRIGHT: (C)2004,JPO&NCIPI</p>
申请公布号 JP2004185803(A) 申请公布日期 2004.07.02
申请号 JP20030402646 申请日期 2003.12.02
申请人 SAMSUNG ELECTRONICS CO LTD 发明人 LEE KYEONG-HAN;SUNG-SOO LEE
分类号 G11C16/02;G11C11/34;G11C16/04;G11C16/06;G11C16/12;G11C16/34;(IPC1-7):G11C16/02 主分类号 G11C16/02
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