发明名称 MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a manufacturing method of a semiconductor device which is excellent in electrical characteristics and includes silicide processing of good controllability. SOLUTION: The manufacturing method of a semiconductor device comprises a process (a) for heating a silicon substrate with an MOS transistor structure at 320 to 480°inside a treatment chamber and a process (b) for depositing Co whereto Ti of 0.3 to 2.0 at% is added on the heated silicon substrate. It is further preferable to set the heating temperature at 350 to 400°C and the Ti doping amount at 0.5 to 1.75 at%. COPYRIGHT: (C)2004,JPO&NCIPI
申请公布号 JP2004186603(A) 申请公布日期 2004.07.02
申请号 JP20020354479 申请日期 2002.12.06
申请人 FUJITSU LTD 发明人 KAWAMURA KAZUO;IKEDA KAZUTO
分类号 H01L21/28;H01L21/336;H01L29/417;H01L29/78;(IPC1-7):H01L21/336 主分类号 H01L21/28
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