发明名称 |
MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To provide a manufacturing method of a semiconductor device which is excellent in electrical characteristics and includes silicide processing of good controllability. SOLUTION: The manufacturing method of a semiconductor device comprises a process (a) for heating a silicon substrate with an MOS transistor structure at 320 to 480°inside a treatment chamber and a process (b) for depositing Co whereto Ti of 0.3 to 2.0 at% is added on the heated silicon substrate. It is further preferable to set the heating temperature at 350 to 400°C and the Ti doping amount at 0.5 to 1.75 at%. COPYRIGHT: (C)2004,JPO&NCIPI
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申请公布号 |
JP2004186603(A) |
申请公布日期 |
2004.07.02 |
申请号 |
JP20020354479 |
申请日期 |
2002.12.06 |
申请人 |
FUJITSU LTD |
发明人 |
KAWAMURA KAZUO;IKEDA KAZUTO |
分类号 |
H01L21/28;H01L21/336;H01L29/417;H01L29/78;(IPC1-7):H01L21/336 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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