发明名称 Method of manufacturing optical device and inspection gauge used for the same
摘要 A rectangular transparent sheet 15 is printed with black dotted density patterns 21 and 22. Each dot of the patterns 21 and 22 is 30 mum in size while dotted area occupied rates of the patterns 21 and 22 range from 3% to 45%. The density patterns 21 and 22 are used for density level assessment of unevenness on a flat panel display device as standard references. Such density level assessment is carried out by comparing the unevenness with the patterns 21 and 22 or by visual inspection with the latter placed on the former.
申请公布号 US2004125367(A1) 申请公布日期 2004.07.01
申请号 US20030665476 申请日期 2003.09.22
申请人 TOSHIBA MATSUSHITA DISPLAY TECHNOLOGY CO., LTD. 发明人 ECHIZENYA KIYOYUKI
分类号 G02F1/13;G01N21/88;G02F1/13357;(IPC1-7):G01N21/88 主分类号 G02F1/13
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