| 摘要 |
A three-dimensional measurement apparatus using multiple striped patterns and a method thereof is disclosed to take a three-dimensional measurement by projecting and transporting the multiple striped patterns having a plurality of stripes, not a single striped pattern that is projected once to the entire area of an object, according to a striped pattern shape, thereby making a faster and more precise three-dimensional measurement, cutting down the entire size, weight and manufacturing cost of the relevant three-dimensional measurement apparatus and, at the same time, reducing measurement time.
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