AUTOMATIC TEST EQUIPMENT PIN CHANNEL WITH T-COIL COMPENSATION

摘要

A passive matching network (T1) is connected to an input/output line (4) for an automatic test equipment drive channel to compensate for capacitances associated with a receiver circuit (Comp1, Comp2) connected to the line, and also an optional current-mode driver circuit (22). The matching circuit preferably comprises a T-coil circuit that can include bridging capacitor (C61); separate T-coil circuits (T1, T2) can be provided to separately compensate for receiver circuit and current-mode driver circuit capacitances. The driver and receiver circuits can be implemented on a common layer (28) of an integrated circuit (24, 26, 28, 30), with the T-coil windings implemented in a separate layer of the same integrated circuit that is spaced from the common layer by at least one dielectric layer (38).