发明名称 |
Advanced recessed gate transistor and a method of forming the same |
摘要 |
In manufacturing a recessed gate transistor, a channel implantation and a source/drain implantation are performed by means of a single implantation mask prior to the formation of a gate opening. Thereafter, the gate opening is formed to a depth that extends substantially to the channel implant so that raised drain and source regions are created which are substantially even with the gate electrode formed in the gate opening. Consequently, expensive and complex epitaxial growth steps can be avoided.
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申请公布号 |
US2004126965(A1) |
申请公布日期 |
2004.07.01 |
申请号 |
US20030609719 |
申请日期 |
2003.06.30 |
申请人 |
KRUEGER CHRISTIAN;FEUDEL THOMAS;GRIMM VOLKER |
发明人 |
KRUEGER CHRISTIAN;FEUDEL THOMAS;GRIMM VOLKER |
分类号 |
H01L21/336;H01L21/8242;H01L29/78;(IPC1-7):H01L21/824 |
主分类号 |
H01L21/336 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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