发明名称 ACTIVE MATRIX DISPLAY AND ITS TESTING METHOD
摘要 <p>Before an EL device is installed, its drive circuit can be tested. An active matrix display has at least a substrate, an electrode for a first display element constituting each pixel provided on the substrate, a first transistor (Q2) connected to the electrode and a current source line (Is(m)), a second transistor (Q1) connected to the gate of the first transistor (Q2) and a data holding signal line (Data(m)), a holding capacitor (C1) connected to the current source line (Is(m)) and the gate of the first transistor (Q2), and a third transistor (Qt) connected to the electrode and a gate signal line (Gate(n-1)) for a second display element adjacent to the first display element and adapted to cause the current flowing from the first transistor (Q2) to the electrode to flow into the gate signal line (Gate(n-1)) for the second display element. A testing method for testing such a display device is also disclosed.</p>
申请公布号 WO2004055772(A1) 申请公布日期 2004.07.01
申请号 WO2003JP14435 申请日期 2003.11.13
申请人 AGILENT TECHNOLOGIES, INC.;NORIMATSU, HIDEYUKI 发明人 NORIMATSU, HIDEYUKI
分类号 G09G3/20;G09G3/30;G09G3/32;H01L51/50;H05B33/00;H05B33/10;H05B33/14;H05B33/12;G09F9/00;G09F9/30;G09G3/00;(IPC1-7):G09G3/30 主分类号 G09G3/20
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