发明名称 |
METHOD AND CIRCUIT FOR REAL TIME COLLECTING MEMORY FAILURE INFORMATION |
摘要 |
<p>A method and circuit for collecting memory failure information on-chip and unloading the information in real time while performing a test of memory embedded in a circuit comprises, for each column or row of a memory under test, testing each memory location of the column or row according to a memory test algorithm under control of a first clock, selectively generating a failure summary on-circuit while testing each column or row of the memory; and transferring the failure summary from the circuit under control of a second clock within the time required to test the next column or row, if any, of the memory under test.</p> |
申请公布号 |
WO2004055829(A1) |
申请公布日期 |
2004.07.01 |
申请号 |
WO2003CA01904 |
申请日期 |
2003.12.09 |
申请人 |
LOGICVISION, INC.;NADEAU-DOSTIE, BENOIT;COTE, JEAN-FRANCOIS |
发明人 |
NADEAU-DOSTIE, BENOIT;COTE, JEAN-FRANCOIS |
分类号 |
G11C29/40;(IPC1-7):G11C29/00 |
主分类号 |
G11C29/40 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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