发明名称 Reflection type mask
摘要 An X-ray mask has a mask pattern, a protection means for forming a dust-proof space for protecting the mask pattern, and an inner atmospheric pressure adjustment hole for ventilating between the dust-proof space and the outer atmosphere. The X-ray mask can be either a transmission type mask in which the mask pattern is formed on a membrane, or a reflection type mask in which a multilayered film reflection layer and the mask pattern are formed on a substrate.
申请公布号 US2004125911(A1) 申请公布日期 2004.07.01
申请号 US20030736693 申请日期 2003.12.17
申请人 CANON KABUSHIKI KAISHA 发明人 CHIBA KEIKO;TSUKAMOTO MASAMI;WATANABE YUTAKA;HARA SHINICHI;MAEHARA HIROSHI
分类号 G03F1/14;G21K3/00;G21K5/00;H01L27/00;(IPC1-7):G21K5/00 主分类号 G03F1/14
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