DEVICE FOR DETECTING LINEAR UNEVEN DEFECTS ON SURFACE OF COIL

摘要

PURPOSE: A surface defect detector is provided to detect linear uneven defects by perceiving the generation of most uneven defects. CONSTITUTION: Many infrared LED(Light Emitting Device) lights(11-14) irradiate the surface of a coil by installing in the side of a coil advance direction. Many CCD(Charge Coupled Device) cameras(21-24) are equipped as the number of the LED lights and located on the upper part of the coil surface to receive light from the LED lights. An image processor make image signals by receiving electric signals about the light from the CCD cameras. Thereby, linear uneven defects are automatically detected without a direct inspection by maximizing the detection of the defects in the advance direction of the coil.