发明名称 MAGNETIC DISK TESTING METHOD AND SURFACE DEFECT TESTING DEVICE
摘要 A MAGNETIC DISK TESTING METHOD IS PROVIDED, WHICH COMPRISES A SURFACE DEFECT TEST STEP OF DETECTING, AS DEFECT DATA, THE SIZE OF SURFACE DEFECT OF A MAGNETIIC DISK, THE CONTINUITY THEREOF, THE NUMBER THEREOF AND THE POSITION THEREOF BY TESTING MAGNETIC DISKS OPTICALLY AND A CLASSIFICATION STEP OF CLASSIFYING THE MAGNETIC DISKS TO FIRST MAGNETIC DISKS, SECOND MAGNETIC DISK AND THIRD MAGNETIC DISKS ON THE BASIS OF THE DEFECT DATA OBTAINED IN THE SURFACE DEFECT TEST STEP. THE FIRST MAGNETIC DISKS HAVE SURFACE DEFECTS WHICH DO NOT PROVIDE ANY PROBLEM ON ELECTRIC CHARACTERISTICS AND ARE TO BE QUALIFIED THROUGH A SUBSEQUENT CERTIFICATION TEST, THE SECOND MAGNETIC DISKS REQUIRE A FURTHER CERTIFICATION TEST FOR DETERMINING WHETHER OR NOT THE SURFACE DEFECTS THEREOF PROVIDE A PROBLEM ON ELECTRIC CHARACTERISTICS AND THE THIRD MAGNETIC DISKS HAVE ELECTRIC CHARACTERISTICS WHICH ARE TO BE CLEARLY DISQUALIFIED WITHOUT NECESSITY OF A FURTHER CERTIFICATION TEST, WHEREIN THE FIRST MAGNETIC DISKS ARE DECIDED AS QUALIFIED AND THE SECOND MAGNETIC DISKS ARE OBJECTS FOR THE CERTIFYING TEST.
申请公布号 MY117417(A) 申请公布日期 2004.06.30
申请号 MYPI9802849 申请日期 1998.06.23
申请人 HITACHI HIGH-TECHNOLOGIES CORPORATION 发明人 IZUO HORAI
分类号 G01N21/86;G01N21/88;G11B5/84 主分类号 G01N21/86
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