发明名称 TEMPERATURE DETECTOR CIRCUIT
摘要 PURPOSE: A temperature detector circuit is provided to minimize a variation of a temperature characteristic of a delay signal and to prevent a cross point of delay signals from being varied by using a multi delay circuit. CONSTITUTION: A temperature detector circuit includes delay sections(40,41), an activating section(42), a detector(43), an encoder(44), a decoder and a path gate(46). The delay section(40) receives an input signal and outputs a delay signal and a delay test signal. The delay section(41) receives an input signal and outputs a plurality of delay signals. The activating section(42) receives an input signal and the delay signal and outputs an activating signal to the decoder(42). The detector(43) receives the delay signals and an active signal from the delay sections(40,41), respectively, and outputs a detection signal.
申请公布号 KR20040055902(A) 申请公布日期 2004.06.30
申请号 KR20020082352 申请日期 2002.12.23
申请人 HYNIX SEMICONDUCTOR INC. 发明人 LEE, GYEONG HA
分类号 G01K7/00;(IPC1-7):G01K7/00 主分类号 G01K7/00
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