发明名称 METHOD FOR ANALYZING SURGE EFFECT OF ELECTRONIC CIRCUIT AND APPARATUS FOR GENERATING SURGE UTILIZED IN THE METHOD
摘要 PURPOSE: A method for analyzing the surge effect of an electric circuit and an apparatus for generating the surge utilized in the method are provided, which measures/analyzes the internal force as well as easily are utilized in the surge effect analysis for an electronic device previously installed on the actual spot. CONSTITUTION: A method for analyzing the surge effect of an electric circuit includes the steps of: generating a surge and an impulse to be generated at an end terminal power environment by inputting the commercial alternative power voltage to the surge generation device consisting of a resistor, a condenser and a switch; inputting the various type of surges and impulses generated at the previous step to the analyzing target electronic circuit; and analyzing the surge effect and the internal force due to the input surge and the impulses in the analyzing target electronic circuit.
申请公布号 KR20040056224(A) 申请公布日期 2004.06.30
申请号 KR20020082796 申请日期 2002.12.23
申请人 RESEARCH INSTITUTE OF INDUSTRIAL SCIENCE & TECHNOLOGY, INCORPORATED FOUNDATION 发明人 HAN, MU HO;LEE, JIN HUI;LEE, SEONG HUI;PARK, TAE JUN
分类号 G01R31/00;(IPC1-7):G01R31/00 主分类号 G01R31/00
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