发明名称 |
METHOD FOR ANALYZING SURGE EFFECT OF ELECTRONIC CIRCUIT AND APPARATUS FOR GENERATING SURGE UTILIZED IN THE METHOD |
摘要 |
PURPOSE: A method for analyzing the surge effect of an electric circuit and an apparatus for generating the surge utilized in the method are provided, which measures/analyzes the internal force as well as easily are utilized in the surge effect analysis for an electronic device previously installed on the actual spot. CONSTITUTION: A method for analyzing the surge effect of an electric circuit includes the steps of: generating a surge and an impulse to be generated at an end terminal power environment by inputting the commercial alternative power voltage to the surge generation device consisting of a resistor, a condenser and a switch; inputting the various type of surges and impulses generated at the previous step to the analyzing target electronic circuit; and analyzing the surge effect and the internal force due to the input surge and the impulses in the analyzing target electronic circuit.
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申请公布号 |
KR20040056224(A) |
申请公布日期 |
2004.06.30 |
申请号 |
KR20020082796 |
申请日期 |
2002.12.23 |
申请人 |
RESEARCH INSTITUTE OF INDUSTRIAL SCIENCE & TECHNOLOGY, INCORPORATED FOUNDATION |
发明人 |
HAN, MU HO;LEE, JIN HUI;LEE, SEONG HUI;PARK, TAE JUN |
分类号 |
G01R31/00;(IPC1-7):G01R31/00 |
主分类号 |
G01R31/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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