发明名称 |
Method and apparatus for testing integrated circuits using a synchronization signal so that all measurements are allotted a time slot of the same length |
摘要 |
A method is provided for testing an integrated circuit in an automatic test environment. According to the method, the automatic test environment is set up, and there is performed a repetitive measurement of at least one electrical quantity representative of an integrated circuit response to a set of prescribed integrated circuit test conditions. The automatic test environment is reset, and the integrated circuit test conditions are changed in synchrony with a synchronization signal having a prescribed periodicity, so that all of the measurements are allotted a time slot of the same length. Also provided is an automatic test equipment apparatus that includes a synchronization generator for supplying a synchronization signal having a prescribed periodicity to means for putting the integrated circuit in a set test condition. The means changes the set test condition in synchrony with the synchronization signal, so that all of the measurements are allotted a time slot of the same length.
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申请公布号 |
US6757632(B2) |
申请公布日期 |
2004.06.29 |
申请号 |
US20020175685 |
申请日期 |
2002.06.20 |
申请人 |
STMICROELECTRONICS S.R.L. |
发明人 |
TUTTOBENE GIUSEPPE;DI GREGORIO GIUSEPPE;RUSSO BIAGIO |
分类号 |
G01R31/3183;G01R31/319;G01R31/3193;(IPC1-7):G01R31/28 |
主分类号 |
G01R31/3183 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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