| 摘要 |
A multi-meter test lead system has a probe having a pointed distal end and a proximal end couplable to supplemental electronic components. An outer sleeve has a distal end with a semi-cylindrical opening and a proximal end with a circular opening at the end and slots adjacent thereto. An inner sleeve has and open distal with an adjacent opening and a pair of diametrically opposed slots adjacent to the proximal end. The inner sleeve is adapted to slidably receive the probe and with the inner sleeve and probe are adapted to be slidably positioned within the outer sleeve to allow movement of the inner sleeve axially inwardly of the outer sleeve in response to a force by the user. A coil spring is within the outer sleeve. A pair of finger pads with an action pin extending through the outer sleeve and inner sleeve.
|
