发明名称 Simplified twin monos fabrication method with three extra masks to standard CMOS
摘要 The invention proposes to simplify fabrication of the twin MONOS memory array. The twin MONOS memory array can be embedded into a standard CMOS circuit by the process of the present invention by adding only three additional mask levels. Conventional floating gate devices need ten or more extra masks. In the present invention, the unique twin MONOS process steps can be inserted into the standard CMOS process flow without any parameter modifications. The present invention also achieves increased endurance by means of reducing the widths of the sidewall control gate and underlying nitride storage region.
申请公布号 US6756271(B1) 申请公布日期 2004.06.29
申请号 US20030386853 申请日期 2003.03.12
申请人 HALO LSI, INC. 发明人 SATOH KIMIHIRO;SAITO TOMOYA;OGURA SEIKI
分类号 H01L21/8246;H01L27/115;(IPC1-7):H01L21/824 主分类号 H01L21/8246
代理机构 代理人
主权项
地址