发明名称 Direct power-to-ground ESD protection with an electrostatic common-discharge line
摘要 ESD protection is provided by local ESD-protection devices between each pad and a common-discharge line (CDL). Each ESD-protection device has p-well or p-substrate taps to a local ground rather than to the CDL, reducing noise coupling from the I/O's through the CDL. Another ESD clamp that bypasses the CDL is provided between each pair of internal power and ground buses. Better protection of core circuits during power-to-ground ESD events is provided by bypassing the CDL since only one ESD clamp rather than two ESD-protection devices must turn on. The ESD clamps and ESD-protection devices can be gate-coupled n-channel transistors with coupling capacitors between the pad and the transistor gate. Devices can also be substrate-triggered transistors or active ESD clamps that include an inverter between a coupling capacitor to the CDL and the n-channel transistor gate.
申请公布号 US6756834(B1) 申请公布日期 2004.06.29
申请号 US20030249670 申请日期 2003.04.29
申请人 PERICOM SEMICONDUCTOR CORP. 发明人 TONG PAUL C. F.;WONG SIU-WENG SIMON;XU PING PING;LIU ZHI QING;CHEN WENSONG
分类号 H01L27/02;H03K5/08;(IPC1-7):H03K5/08 主分类号 H01L27/02
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