发明名称 |
SEMICONDUCTOR MEMORY HAVING VERTICAL CHARGE TRAPPING MEMORY CELLS CAPABLE OF CONTACTING BIT LINES ON GRAVE BOTTOMS AT LOW COST AND MANUFACTURING METHOD THEREOF |
摘要 |
PURPOSE: A semiconductor memory having vertical charge trapping memory cells and a manufacturing method thereof are provided to contact bit lines on grave bottoms at a low cost. CONSTITUTION: A plurality of graves are formed on a semiconductor body or a surface of a substrate with a spacing among them. A memory transistor is disposed on a cell compartment(10). The cell transistor includes a channel region isolated from a gate electrode disposed in the grave. The channel region joins a doped region serving as a source/drain region. A series of memory layers including a first intermediate layer, a memory layer and a second intermediate layer are disposed between the gate electrode and a terminal of either a source or drain of the channel region. The semiconductor body and the source/drain region are interconnected via an upper bit line(15). The graves are alternating between an insulated grave and an active grave. A bit line junction(16) is provided on the upper bit line outside the cell compartment while an additional bit line junction(17) is provided on a lower bit line. The bit line junctions are disposed on sides facing each other.
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申请公布号 |
KR20040055705(A) |
申请公布日期 |
2004.06.26 |
申请号 |
KR20030094186 |
申请日期 |
2003.12.20 |
申请人 |
INFINEON TECHNOLOGIES AG |
发明人 |
KLEINT CHRISTOPH;DEPPE JOACHIM;LUDWIG CHRISTOPH;SACHSE JENS UWE |
分类号 |
H01L21/8247;H01L21/28;H01L21/336;H01L21/8234;H01L21/8246;H01L27/105;H01L27/115;H01L29/788;H01L29/792;(IPC1-7):H01L27/115 |
主分类号 |
H01L21/8247 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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