SOCKET AND SEMICONDUCTOR IC TEST INFORMATION MANAGEMENT SYSTEM USING THE SAME

摘要

PURPOSE: A socket and a semiconductor IC test information management system using the same are provided to manage an exchanging period of the socket by installing a storage unit within the socket. CONSTITUTION: A socket includes a main body and a storage unit(201). A semiconductor IC is mounted on the main body. The main body includes elements for testing the semiconductor IC. The storage unit is installed on a predetermined position of the main body in order to store the test information according to a test process and a test result of the semiconductor IC. A semiconductor IC test information management system using the socket includes a socket(200) for storing the test information and a tester(210). The tester includes a tester signal controller for generating a test signal and analyzing a response signal and a test controller for controlling all operations of the tester.