发明名称 |
Method of fabricating lead-free solder bumps |
摘要 |
A method of fabricating lead-free solder bumps, including providing a wafer having a protective layer with an open electrode pad; forming an UBM (under bump metallization) layer on the wafer; lithographing a photoresist on the UBM layer, excluding a portion of the UBM layer corresponding to the electrode pad; forming a copper layer on the portion of the UBM layer corresponding to the electrode pad; plating solder on the copper layer; removing the photoresist; and etching the UBM layer using the solder as a mask, and reflowing the solder and fabricating solder bumps. |
申请公布号 |
US2004121267(A1) |
申请公布日期 |
2004.06.24 |
申请号 |
US20030706033 |
申请日期 |
2003.11.13 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
JANG SE-YOUNG |
分类号 |
H01L21/60;B23K35/26;B23K35/40;G03F7/00;H01L21/288;H01L23/485;(IPC1-7):G03F7/00 |
主分类号 |
H01L21/60 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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