发明名称 Method of fabricating lead-free solder bumps
摘要 A method of fabricating lead-free solder bumps, including providing a wafer having a protective layer with an open electrode pad; forming an UBM (under bump metallization) layer on the wafer; lithographing a photoresist on the UBM layer, excluding a portion of the UBM layer corresponding to the electrode pad; forming a copper layer on the portion of the UBM layer corresponding to the electrode pad; plating solder on the copper layer; removing the photoresist; and etching the UBM layer using the solder as a mask, and reflowing the solder and fabricating solder bumps.
申请公布号 US2004121267(A1) 申请公布日期 2004.06.24
申请号 US20030706033 申请日期 2003.11.13
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 JANG SE-YOUNG
分类号 H01L21/60;B23K35/26;B23K35/40;G03F7/00;H01L21/288;H01L23/485;(IPC1-7):G03F7/00 主分类号 H01L21/60
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