发明名称 MULTILAYER PHOTORESIST SYSTEM
摘要 <P>PROBLEM TO BE SOLVED: To provide a silicon-containing photoresist system of high plasma etching resistance and antireflectivity and high resolution. <P>SOLUTION: The photoresist system is composed of a structural component containing an aromatic group and/or alicyclic group and an ingredient containing a chromophore in a lower layer. The upper layer resist is composed of a photoactive component and a silicon-containing ingredient. The chromophore contains an anthracene group and the alicyclic group contains any of an adamantyl, norbornyl or isobornyl group. <P>COPYRIGHT: (C)2004,JPO
申请公布号 JP2004177952(A) 申请公布日期 2004.06.24
申请号 JP20030389094 申请日期 2003.11.19
申请人 ROHM & HAAS ELECTRONIC MATERIALS LLC 发明人 JAMES F CAMERON;GRONBECK DANA A;BARCLAY GEORGE G
分类号 G03F7/11;G03F7/075;G03F7/09;H01L21/027 主分类号 G03F7/11
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