发明名称 |
MULTILAYER PHOTORESIST SYSTEM |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a silicon-containing photoresist system of high plasma etching resistance and antireflectivity and high resolution. <P>SOLUTION: The photoresist system is composed of a structural component containing an aromatic group and/or alicyclic group and an ingredient containing a chromophore in a lower layer. The upper layer resist is composed of a photoactive component and a silicon-containing ingredient. The chromophore contains an anthracene group and the alicyclic group contains any of an adamantyl, norbornyl or isobornyl group. <P>COPYRIGHT: (C)2004,JPO |
申请公布号 |
JP2004177952(A) |
申请公布日期 |
2004.06.24 |
申请号 |
JP20030389094 |
申请日期 |
2003.11.19 |
申请人 |
ROHM & HAAS ELECTRONIC MATERIALS LLC |
发明人 |
JAMES F CAMERON;GRONBECK DANA A;BARCLAY GEORGE G |
分类号 |
G03F7/11;G03F7/075;G03F7/09;H01L21/027 |
主分类号 |
G03F7/11 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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