发明名称 DEFECT INSPECTION METHOD AND APPARATUS THEREOF
摘要 PROBLEM TO BE SOLVED: To provide a defect inspection method, capable of clearly distinguishing a protrusion to be a defect from a foreign matter which is not to be a defect in the case of inspecting a protrusion defect in an object work through the use of laser light. SOLUTION: The surface of the work to be inspected 1 is irradiated with the laser light 19 via an S polarizing filter 18. A reflected light 23 from the work to be inspected is detected via an S polarizing filter 24. According to the level of the reflected light detected by an image processing device 30, a protrusion defect, in which the surface is protruded is distinguished from a foreign matter defect which adheres to the surface and alters the state of polarization of the incident laser light, and only the protrusion defect is detected. COPYRIGHT: (C)2004,JPO
申请公布号 JP2004177356(A) 申请公布日期 2004.06.24
申请号 JP20020346596 申请日期 2002.11.29
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 NAKAJIMA SHINYA;NAGASAKI TATSUO;NOMURA TAKESHI
分类号 G01B11/30;G01N21/956;H01L21/66;(IPC1-7):G01N21/956 主分类号 G01B11/30
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