发明名称 ELECTRON BEAM LITHOGRAPHY METHOD USING ELECTRON BEAM TO REDUCE TURN-ON VOLTAGE AND RELATIVELY INCREASE CURRENT DENSITY
摘要 PURPOSE: An electron beam lithography method using an electron beam is provided to reduce a turn-on voltage and relatively increase a current density by irradiating light to a field emitter from the outside when electrons are emitted from the field emitter. CONSTITUTION: A photoresist layer stacked on a substrate is exposed by using the electron beam(4) emitted from a field emitter(6). While the photoresist layer is exposed by the electron beam emitted from the field emitter, light is irradiated to the field emitter to decrease the turn-on voltage of the field emitter and increase a current density. The field emitter is made of diamond or non-crystalline carbon. The light irradiated to the field emitter is visible rays or ultraviolet rays.
申请公布号 KR100438806(B1) 申请公布日期 2004.06.24
申请号 KR19970047190 申请日期 1997.09.12
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM, SEONG HUN;LEE, NAE SEONG;HAN, IN TAEK
分类号 H01L21/027;(IPC1-7):H01L21/027 主分类号 H01L21/027
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