发明名称 |
ELECTRON BEAM LITHOGRAPHY METHOD USING ELECTRON BEAM TO REDUCE TURN-ON VOLTAGE AND RELATIVELY INCREASE CURRENT DENSITY |
摘要 |
PURPOSE: An electron beam lithography method using an electron beam is provided to reduce a turn-on voltage and relatively increase a current density by irradiating light to a field emitter from the outside when electrons are emitted from the field emitter. CONSTITUTION: A photoresist layer stacked on a substrate is exposed by using the electron beam(4) emitted from a field emitter(6). While the photoresist layer is exposed by the electron beam emitted from the field emitter, light is irradiated to the field emitter to decrease the turn-on voltage of the field emitter and increase a current density. The field emitter is made of diamond or non-crystalline carbon. The light irradiated to the field emitter is visible rays or ultraviolet rays.
|
申请公布号 |
KR100438806(B1) |
申请公布日期 |
2004.06.24 |
申请号 |
KR19970047190 |
申请日期 |
1997.09.12 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
KIM, SEONG HUN;LEE, NAE SEONG;HAN, IN TAEK |
分类号 |
H01L21/027;(IPC1-7):H01L21/027 |
主分类号 |
H01L21/027 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|