Liquid impurity characterization method in which semiconductor emitters are used to project radiation into a liquid sample within a pipe, with the transmitted or scattered light analyzed to determine impurity properties

摘要

Method for characterization of liquid impurities in which semiconductor emitters are used. Their radiation is emitted and passes through the liquid being tested, where it is modified. The radiation travels in straight lines and or is deflected by the impurities, preferably at 90degrees to the main transmission direction. It is detected by selectively sensitive photo-receivers, with the receiver outputs input to an evaluation unit for analysis. The invention also relates to a corresponding device for implementation of the inventive method.