发明名称 SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor integrated circuit device which can reduce the off-state leakage current on standby, and which can also reduce the leakage current paths, resulting in preventing an increase in manufacturing processes. SOLUTION: The semiconductor integrated circuit device comprises a network logic circuit block having a MOS transistor which performs a logic operation constituted of a pass transistor logic, a buffer circuit block which amplifies an output signal of the network logic circuit block, and MOS transistors 44 and 50 which are formed in a semiconductor layer of a fully-depleted type SOI substrate wherein the semiconductor layer is formed on a semiconductor substrate 51 via a buried insulation layer 52. COPYRIGHT: (C)2004,JPO
申请公布号 JP2004179267(A) 申请公布日期 2004.06.24
申请号 JP20020341505 申请日期 2002.11.25
申请人 SHARP CORP 发明人 OZORA KENJI;YONEMARU MASASHI
分类号 H01L21/822;H01L21/8238;H01L27/04;H01L27/08;H01L27/092;H01L27/12;H01L29/786;H03K19/0944;(IPC1-7):H01L29/786;H01L21/823;H03K19/094 主分类号 H01L21/822
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