发明名称 Specimen holder having an insert for atomic force microscopy
摘要 A specimen holder (10) is proposed in order to create a capability for preparing, in a cutting device, in particular a microtome or ultramicrotome, a specimen that is to examined in an AFM. The specimen holder (10) is embodied in several parts. It comprises an insert (12) in which the specimen is secured. Also provided is a receiving ring (14) in which the insert (12) can be received. The insert together with the receiving ring (14) is mounted, in particular thread-joined, on a base element (16). As a result of the mounting of the receiving ring (14) on the base element (16), the insert together with the specimen is fixed in its position.
申请公布号 US2004120862(A1) 申请公布日期 2004.06.24
申请号 US20030732076 申请日期 2003.12.10
申请人 LEICA MIKROSYSTEME GMBH 发明人 LANG ANTON;WOGRITSCH RAINER;NOWAK ANDREAS
分类号 G01N1/06;G01Q30/20;(IPC1-7):B01L3/00 主分类号 G01N1/06
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