发明名称 Methods and apparatus for testing data lines
摘要 Systems and methods for testing data lines to determine signal degradation in the data lines. A system includes a signal generator for generating a test pattern and for transferring the test pattern through the data lines. The system also includes an analyzer communicatively connected to the data lines to determine degradation of the test pattern in the data lines. The signal generator generates and transfers a first test pattern through the data lines. The first test pattern includes a first portion having a first polarity and a second portion having a second polarity. The signal generator then generates and transfers a second test pattern through the data lines in response to transferring the first test pattern. The test patterns may be repeated one or more times to determine cross talk caused by inductive coupling between data lines and additive reflections.
申请公布号 US2004123204(A1) 申请公布日期 2004.06.24
申请号 US20020328699 申请日期 2002.12.23
申请人 GRIMES G. KEITH;ACHILLES GREGORY W. 发明人 GRIMES G. KEITH;ACHILLES GREGORY W.
分类号 G01R31/04;G01R31/28;G01R31/3183;(IPC1-7):G06F11/00 主分类号 G01R31/04
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