发明名称 |
METHOD FOR FABRICATING POLYSILICON THIN FILM TO PROPERLY CONTROL SIZE OF GRAIN IN SOLID STATE CRYSTALLIZATION |
摘要 |
PURPOSE: A method for fabricating a polysilicon thin film is provided to properly control the size of a grain in solid state crystallization by shortening a time interval of generating a nucleus and by arbitrarily controlling the density of a crystalline nucleus according to a process condition. CONSTITUTION: A crystallized silicon nucleus(21) is formed on a substrate(10). Amorphous silicon is deposited on the crystallized silicon nucleus and the substrate. The amorphous silicon is maintained in a predetermined temperature atmosphere and is crystallized with respect to the crystallized nucleus. The size of a polysilicon grain is controlled by adjusting the density of grain silicon nuclei when the crystallized silicon nucleus is formed on the substrate.
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申请公布号 |
KR100438803(B1) |
申请公布日期 |
2004.06.24 |
申请号 |
KR19970019304 |
申请日期 |
1997.05.19 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
PARK, YEONG SU;KIM, SEONG HUN;HAN, IN TAEK |
分类号 |
H01L27/12;(IPC1-7):H01L27/12 |
主分类号 |
H01L27/12 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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