发明名称 METHOD FOR FABRICATING POLYSILICON THIN FILM TO PROPERLY CONTROL SIZE OF GRAIN IN SOLID STATE CRYSTALLIZATION
摘要 PURPOSE: A method for fabricating a polysilicon thin film is provided to properly control the size of a grain in solid state crystallization by shortening a time interval of generating a nucleus and by arbitrarily controlling the density of a crystalline nucleus according to a process condition. CONSTITUTION: A crystallized silicon nucleus(21) is formed on a substrate(10). Amorphous silicon is deposited on the crystallized silicon nucleus and the substrate. The amorphous silicon is maintained in a predetermined temperature atmosphere and is crystallized with respect to the crystallized nucleus. The size of a polysilicon grain is controlled by adjusting the density of grain silicon nuclei when the crystallized silicon nucleus is formed on the substrate.
申请公布号 KR100438803(B1) 申请公布日期 2004.06.24
申请号 KR19970019304 申请日期 1997.05.19
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 PARK, YEONG SU;KIM, SEONG HUN;HAN, IN TAEK
分类号 H01L27/12;(IPC1-7):H01L27/12 主分类号 H01L27/12
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