发明名称 |
MICRO-DIMENSIONAL STANDARD SAMPLE AND ITS MANUFACTURING METHOD |
摘要 |
<p><P>PROBLEM TO BE SOLVED: To stick an index for indicating the direction of a diffraction grating pattern to a chip itself to judge the pattern direction accurately. <P>SOLUTION: A shape of the chip is made anisotropic, or a ruled line and a mark are formed on the chip, so as to decide the direction of the diffraction grating pattern direction by an appearance of the chip. Calibration work is executed accurately and surely because the direction of the diffraction grating pattern is able to be surely determined to attach the chip onto a sample table. <P>COPYRIGHT: (C)2004,JPO</p> |
申请公布号 |
JP2004177149(A) |
申请公布日期 |
2004.06.24 |
申请号 |
JP20020340468 |
申请日期 |
2002.11.25 |
申请人 |
HITACHI SCI SYST LTD;HITACHI HIGH-TECHNOLOGIES CORP |
发明人 |
NAGAKUBO KOHEI;YAMADA MITSUHIKO;KUROSAWA KOICHI |
分类号 |
G01B15/00;B23K26/00;G01D18/00;G01N1/28;G01Q40/02;H01J37/20;H01J37/28;H01J49/00;(IPC1-7):G01B15/00 |
主分类号 |
G01B15/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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