发明名称 FOLLOWING APPARATUS AND THICKNESS MEASURING INSTRUMENT HAVING THE SAME
摘要 PROBLEM TO BE SOLVED: To provide a following apparatus that can be easily attached to or detached from a material whose traverse plane is circular, and to provide a thickness measuring instrument for improving working efficiency and measurement precision in measurement. SOLUTION: The following apparatus comprises a rotating body 3 that can be inserted from the direction of the traverse plane of the material whose traverse plane is circular and has a cutout section leading to a center axis section; a plurality of following rollers 3e being provided radially along the outer periphery surface of the material at the center axis section of the rotating body; a frame body that allows the rotating body to be rotated freely and has a cutout section being continuous to the cutout section 4 of the rotating body; and a rotating apparatus 6 for giving rotational force to the rotating body 3, thus energizing the following roller 3e located at the tip side of the cutout section in the direction of the center axis. A thickness probe is provided toward the material at the deep section of the cutout section 4 of the rotating body 3. A position detector 7 of the rotating body is provided at the frame body. Then, a data processor for measuring the thickness of the material by receiving a signal from the probe and that from the position detector 7 is provided, thus easily attaching to or detaching from the material whose traverse plane is circular and improving working efficiency and measurement precision in measurement. COPYRIGHT: (C)2004,JPO
申请公布号 JP2004177123(A) 申请公布日期 2004.06.24
申请号 JP20020339821 申请日期 2002.11.22
申请人 SUMITOMO METAL IND LTD 发明人 TAKIMOTO GIICHI
分类号 G01B21/00;G01B21/08;G01N29/26;(IPC1-7):G01B21/00 主分类号 G01B21/00
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