| 摘要 |
Testing and analysis is performed on an incoming data stream. The incoming data is sampled at a reference voltage threshold and a reference location in a data cycle so as to produce a reference data signal. The incoming data is also sampled so as to produce a data signal. At least one of a voltage threshold and a location in the data cycle for sampling are respectively varied from the reference voltage threshold and the reference location in the data cycle for the sampling to produce the data signal. The reference data signal is compared to the data signal in order to detect bit errors in the data signal. Additional analysis is performed using the reference data signal.
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