发明名称 Dynamic register with low clock rate testing capability
摘要 A method for refreshing data in a circuit element included in a dynamic register. A static loop is coupled to the circuit element as a feedback path from the output terminal to the input terminal of the circuit element. A control signal is provided to the static loop. The static loop is activated via the control signal to refresh the data in the circuit element.
申请公布号 US2004120203(A1) 申请公布日期 2004.06.24
申请号 US20030731078 申请日期 2003.12.09
申请人 HATAMIAN MEHDI 发明人 HATAMIAN MEHDI
分类号 G01R31/30;G01R31/317;G01R31/3185;H04B3/23;H04B3/32;H04L1/00;H04L1/24;H04L7/02;H04L7/033;H04L25/03;H04L25/06;H04L25/14;H04L25/49;H04L25/497;(IPC1-7):G11C5/00;G11C7/00 主分类号 G01R31/30
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