发明名称 METHOD OF MAKING A SOCKET TO PERFORM TESTING ON INTEGRATED CIRCUITS AND SUCH A SOCKET
摘要 A interconnect structure is inexpensively manufactured and easily insertable into a socket. The interconnect structure is manufactured by forming a sacrificial substrate with cavities that is covered by a masking material having openings corresponding to the cavities. A first plating process is performed by depositing conductive material, followed by coupling wires within the openings and performing another plating process by depositing more conductive material. The interconnect structure is completed by first removing the masking material and sacrificial substrate. Ends of the wires are coupled opposite now-formed contact structures to a board. To complete the socket, a support device is coupled to the board to hold a tested integrated circuit.
申请公布号 WO2004053976(A2) 申请公布日期 2004.06.24
申请号 WO2003US38463 申请日期 2003.12.02
申请人 FORMFACTOR, INC. 发明人 KHANDROS, IGOR, K.;MATHIEU, GAETAN, L.;REYNOLDS, CARL, V.
分类号 G01R1/04;G01R1/073;G01R3/00 主分类号 G01R1/04
代理机构 代理人
主权项
地址