发明名称 Substrate processing apparatus used in manufacture of e.g. semiconductor wafer, has gas circulating tube extended outside substrate transfer chamber and connected to corresponding portions of substrate transfer chamber
摘要 <p>A contamination controlling system (130) has a gas inlet port (132) connected to a substrate transfer chamber and through which purging gas is supplied into the substrate transfer chamber. A gas circulating tube (138), extended outside the substrate transfer chamber (110), is connected to corresponding portions of the substrate transfer chamber to recirculate purged gas through the substrate transfer chamber. An independent claim is included for a substrate processing method.</p>
申请公布号 DE10353326(A1) 申请公布日期 2004.06.24
申请号 DE2003153326 申请日期 2003.11.14
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 AHN, YO-HAN;KIM, KI-DOO;LEE, SOO-WOONG;KIM, HYEOG-KI;HWANG, JUNG-SUNG
分类号 H01L21/68;B65G49/07;H01L21/00;H01L21/673;H01L21/677;(IPC1-7):H01L21/18 主分类号 H01L21/68
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