发明名称 MANUFACTURING OF INSULATING FILM LAYER ISOLATION IC
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a versatile method for manufacturing an integrated circuit by a flexible film formed by an extremely thin stress reducing dielectric material such as silicon dioxide and silicon nitride and a semiconductor layer. <P>SOLUTION: Semiconductor devices (24, 26, 28 to 30) are formed in a semiconductor layer of a film (36). At first, the semiconductor film layer (36) is formed from a substrate (18) of standard thickness, and next, a thin surface layer of the substrate is etched or polished. In other version, a support for the conventional bonding integrated circuit die and a flexible film as electrically mutual connection are used, and a mutual connection part is formed in a plurality of layers in the film. By this method, a plurality of dies can be connected to one of the films, and the film is subsequently packaged as a multi-chip module. <P>COPYRIGHT: (C)2004,JPO</p>
申请公布号 JP2004179670(A) 申请公布日期 2004.06.24
申请号 JP20030411689 申请日期 2003.12.10
申请人 LEEDY GLENN J 发明人 LEEDY GLENN J
分类号 G21K5/02;B81B3/00;G02F1/13;G03F7/20;G11C29/00;H01L21/027;H01L21/306;H01L21/331;H01L21/336;H01L21/76;H01L21/762;H01L21/764;H01L21/822;H01L21/8234;H01L21/8238;H01L21/98;H01L23/48;H01L23/538;H01L25/065;H01L27/00;H01L27/02;H01L27/08;H01L27/088;H01L27/092;H01L27/12;H01L29/732;H01L29/78;H01L29/786;H05G1/00;(IPC1-7):H01L27/12;H01L21/823 主分类号 G21K5/02
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