| 摘要 |
<p><P>PROBLEM TO BE SOLVED: To provide a semiconductor device with its power consumption efficiently reduced by constantly setting optimum data for each LSI. <P>SOLUTION: The semiconductor device has a replica control circuit 15 having a decoder circuit 151 for reading data to be determined by the state of fuse in the fuse circuit 152, and for generating a control signal SADJ for a replica circuit 12 by decoding the read data. The device further has a replica circuit 12 capable of selecting the number of stages in the line of elements according to the control signal SADJ indicating structural data set in the replica control circuit 15, and capable of adjusting the delay characteristics to be the same as the critical path characteristics of a target circuit 11. In this way, dispersion in characteristics due to the manufacturing process is properly dealt with after the manufacturing of LSIs. <P>COPYRIGHT: (C)2004,JPO</p> |
