| 摘要 |
A pin electronics circuit for use in automatic test equipment is disclosed. The pin electronics circuit includes a pin driver having an output adapted for coupling to a device-under-test pin, and a first input. AC input circuitry couples to a pattern generator to receive pattern test signals while DC input circuitry connects to a DC parametric controller. Selector circuitry selectively couples the AC and DC input circuitry to the pin driver first input.
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