| 摘要 |
PROBLEM TO BE SOLVED: To save failures produced after assembling process, using an inexpensive tester. SOLUTION: An error detection circuit 13 compares read data from a memory cell with data from an external I/O terminal 12 by a comparator circuit 18 for deciding the quality of the memory cell. The error detection circuit 13 outputs a detection signal COMPRERR, when the memory cell is of poor quality. A self-fused program circuit 20 receives the detection signal COMPERR for latching to a latch circuit LAi with an external address as a relief address. A counter Ci and a switching circuit SW transfer the relief address latched by the latch circuit LAi to a fuse program circuit FPi one bit by one bit, thus programming the relief address. COPYRIGHT: (C)2004,JPO
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